Soft X-Ray microscopic investigation on self assembling nanocrystals

  1. Benk, M.
  2. Bergmann, K.
  3. Querejeta-Fernández, A.
  4. Srivastava, S.
  5. Kotov, N.A.
  6. Schaefer, D.
  7. Wilhein, T.
Proceedings:
AIP Conference Proceedings

ISSN: 0094-243X,  1551-7616

ISBN: 9780735409255

Year of publication: 2010

Volume: 1365

Pages: 433-436

Type: Conference paper

DOI: 10.1063/1.3625395 GOOGLE SCHOLAR lock_openOpen access editor
Data source: Scopus