Workload-Aware Electromigration Analysis in Emerging Spintronic Memory Arrays

  1. Nair, S.M.
  2. Mayahinia, M.
  3. Tahoori, M.B.
  4. Perumkunnil, M.
  5. Zahedmanesh, H.
  6. Croes, K.
  7. Garello, K.
  8. Marinelli, T.
  9. Evenblij, T.
  10. Kar, G.S.
  11. Catthoor, F.
Journal:
IEEE Transactions on Device and Materials Reliability

ISSN: 1558-2574,  1530-4388

Year of publication: 2021

Volume: 21

Issue: 2

Pages: 258-266

Type: Article

DOI: 10.1109/TDMR.2021.3074251 GOOGLE SCHOLAR
Data source: Scopus