Non-invasive testing of physical systems using topological sensitivity

  1. Higuera, M.
  2. Perales, J.M.
  3. Rapún, M.-L.
  4. Vega, J.M.
Revue:
Applied Sciences (Switzerland)

ISSN: 2076-3417

Année de publication: 2021

Volumen: 11

Número: 3

Pages: 1-16

Type: Article

DOI: 10.3390/APP11031341 GOOGLE SCHOLAR lock_openAccès ouvert editor