Topological sensitivity for solving inverse multiple scattering problems in three-dimensional electromagnetism. Part I: One step method

  1. Louëry, F.L.
  2. Rapún, M.-L.
Journal:
SIAM Journal on Imaging Sciences

ISSN: 1936-4954

Year of publication: 2017

Volume: 10

Issue: 3

Pages: 1291-1321

Type: Article

DOI: 10.1137/17M1113850 GOOGLE SCHOLAR
Data source: Scopus