Impact of memory voltage scaling on accuracy and resilience of deep learning based edge devices

1. Denkinger, B.W.
2. Ponzina, F.
3. Basu, S.S.
4. Bonetti, A.
5. Balasi, S.
6. Ruggiero, M.
7. Peon-Quiros, M.
8. Rossi, D.
9. Burg, A.
10. Atienza, D.