Extended symbol correction algorithm for group testing based non-binary error correction codes of minimum distance dq < 5
- Garcia-Herrero, F.
- Sánchez-Macián, A.
- Maestro, J.A.
- Flanagan, M.F.
Journal:
Microelectronics Reliability
ISSN: 0026-2714
Year of publication: 2020
Volume: 113
Type: Article