Extended symbol correction algorithm for group testing based non-binary error correction codes of minimum distance dq < 5
- Garcia-Herrero, F.
- Sánchez-Macián, A.
- Maestro, J.A.
- Flanagan, M.F.
Revue:
Microelectronics Reliability
ISSN: 0026-2714
Année de publication: 2020
Volumen: 113
Type: Article