Reducing false positives due to double adjacent errors in instruction TLBs

  1. Sánchez-Macián, A.
  2. Aranda, L.A.
  3. Reviriego, P.
  4. Maestro, J.A.
Revista:
Microelectronics Reliability

ISSN: 0026-2714

Ano de publicación: 2019

Volume: 102

Tipo: Artigo

DOI: 10.1016/J.MICROREL.2019.113494 GOOGLE SCHOLAR
Fonte de datos: Scopus