Reliability of 3D memories using Orthogonal Latin Square codes
- Sánchez-Macián, A.
- Garcia-Herrero, F.
- Maestro, J.A.
Revue:
Microelectronics Reliability
ISSN: 0026-2714
Année de publication: 2019
Volumen: 95
Pages: 74-80
Type: Article