A method to recover critical bits under a double error in SEC-DED protected memories

  1. Liu, S.
  2. Reviriego, P.
  3. Xiao, L.
  4. Maestro, J.A.
Journal:
Microelectronics Reliability

ISSN: 0026-2714

Year of publication: 2017

Volume: 73

Pages: 92-96

Type: Letter

DOI: 10.1016/J.MICROREL.2017.04.020 GOOGLE SCHOLAR
Data source: Scopus