Error-detection enhanced decoding of difference set codes for memory applications

  1. Reviriego, P.
  2. Flanagan, M.F.
  3. Liu, S.-F.
  4. Maestro, J.A.
Journal:
IEEE Transactions on Device and Materials Reliability

ISSN: 1530-4388,  1558-2574

Year of publication: 2012

Volume: 12

Issue: 2

Pages: 335-340

Type: Article

DOI: 10.1109/TDMR.2012.2183873 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus