A (64,45) triple error correction code for memory applications

  1. Reviriego, P.
  2. Flanagan, M.
  3. Maestro, J.A.
Journal:
IEEE Transactions on Device and Materials Reliability

ISSN: 1530-4388,  1558-2574

Year of publication: 2012

Volume: 12

Issue: 1

Pages: 101-106

Type: Article

DOI: 10.1109/TDMR.2011.2169413 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus