Review and Comparison of Irradiation Response and Annealing Models for High-Sensitivity RADFETs

  1. Benito-Parejo, M.
  2. Ibarmia, S.
  3. Portillo, P.
Actas:
2017 17th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2017

ISBN: 9781538612613

Año de publicación: 2017

Tipo: Aportación congreso

DOI: 10.1109/RADECS.2017.8696175 GOOGLE SCHOLAR
Fuente de los datos: Scopus