Sensitivity and uniformity in statistical randomness tests
- Almaraz Luengo, E.
- Leiva Cerna, M.
- García Villalba, L.J.
- Hurley-Smith, D.
- Hernandez-Castro, J.
Zeitschrift:
Journal of Information Security and Applications
ISSN: 2214-2126, 2214-2134
Datum der Publikation: 2022
Ausgabe: 70
Art: Artikel