Sensitivity and uniformity in statistical randomness tests
- Almaraz Luengo, E.
- Leiva Cerna, M.
- García Villalba, L.J.
- Hurley-Smith, D.
- Hernandez-Castro, J.
Aldizkaria:
Journal of Information Security and Applications
ISSN: 2214-2126, 2214-2134
Argitalpen urtea: 2022
Alea: 70
Mota: Artikulua