EXAFS and XRD characterization of iron thin films prepared by sputtering at very low temperatures

  1. Jiménez-Villacorta, F.
  2. Muñoz-Martín, A.
  3. Vila, M.
  4. Prieto, C.
  5. Traverse, A.
Proceedings:
Physica Scripta T

ISSN: 0281-1847

Year of publication: 2005

Volume: T115

Pages: 450-453

Type: Article

DOI: 10.1238/PHYSICA.TOPICAL.115A00450 GOOGLE SCHOLAR lock_openOpen access editor
Data source: Scopus