Main memory organization trade-offs with DRAM and STT-MRAM options based on gem5-NVMain simulation frameworks
- Komalan, Manu
- Rock, Oh Hyung
- Hartmann, Matthias
- Sakhare, Sushil
- Tenllado, Christian
- Gomez, Jose Ignacio
- Kar, Gouri Sankar
- Furnemont, Arnaud
- Catthoor, Francky
- Senni, Sophiane
- Novo, David
- Gamatie, Abdoulaye
- Torres, Lionel
ISSN: 1530-1591
ISBN: 978-3-9819-2630-9
Año de publicación: 2018
Páginas: 103-108
Congreso: Design, Automation and Test in Europe Conference and Exhibition (DATE)
Tipo: Aportación congreso