A dynamic multi-stage slacks-based measure data envelopment analysis model with knowledge accumulation and technological evolution
- Santos Arteaga, F.J.
- Tavana, M.
- Di Caprio, D.
- Toloo, M.
ISSN: 0377-2217
Year of publication: 2019
Volume: 278
Issue: 2
Pages: 448-462
Type: Article