Robust inference for nondestructive one-shot device testing under step-stress model with exponential lifetimes

  1. Balakrishnan, N.
  2. Castilla, E.
  3. Jaenada, M.
  4. Pardo, L.
Aldizkaria:
Quality and Reliability Engineering International

ISSN: 1099-1638,  0748-8017

Argitalpen urtea: 2023

Alea: 39

Zenbakia: 4

Orrialdeak: 1192-1222

Mota: Artikulua

DOI: 10.1002/QRE.3287 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus