Robust inference for nondestructive one-shot device testing under step-stress model with exponential lifetimes
- Balakrishnan, N.
- Castilla, E.
- Jaenada, M.
- Pardo, L.
ISSN: 1099-1638, 0748-8017
Argitalpen urtea: 2023
Alea: 39
Zenbakia: 4
Orrialdeak: 1192-1222
Mota: Artikulua