Characterization of parasitics in microwave devices by comparing S and noise parameter measurements with two different on wafer calibration techniques
- Miranda, JM
- Fager, C
- Zirath, H
- Sakalas, P
- Munoz, S
- Sebastian, JL
ISSN: 1091-5281
ISBN: 0-7803-6646-8
Año de publicación: 2001
Páginas: 530-533
Congreso: 18th IEEE Instrumentation and Measurement Technology Conference (IMTC/2001)
Tipo: Aportación congreso