Electron Energy Loss Spectroscopy of Semiconductor Nanostructures and Oxides
- Zhou, Wu
- Varela, Maria
- Idrobo, Juan-Carlos
- Pantelides, Sokrates T.
- Pennycook, Stephen J.
Livre:
METROLOGY AND DIAGNOSTIC TECHNIQUES FOR NANOELECTRONICS
- Ma, Z (coord.)
- Seiler, DG (coord.)
ISBN: 978-981-4745-09-3, 978-981-4745-08-6
Année de publication: 2017
Pages: 663-709
Type: Chapitre d'ouvrage