Impurity segregation in Al doped GaSb studied by cathodoluminescence microscopy
- Hidalgo, P
- Mendez, B
- Piqueras, J
- Dutta, PS
- Ashok, S (coord.)
- Chevallier, J (coord.)
- Sumino, K (coord.)
- Sopori, BL (coord.)
- Gotz, W (coord.)
ISSN: 0272-9172
ISBN: 1-55899-416-5
Año de publicación: 1998
Volumen: 510
Páginas: 639-644
Congreso: Symposium on Defect and Impurity Engineered Semiconductors II at the Materials-Research-Society Spring Meeting
Tipo: Aportación congreso