Evaluation of the Sensitivity of a COTS 90-nm SRAM Memory at Low Bias Voltage

  1. Antonio Clemente, Juan
  2. Hubert, Guillaume
  3. Franco, Francisco J.
  4. Villa, Francesca
  5. Baylac, Maud
  6. Mecha, Hortensia
  7. Velazco, Raoul
Libro:
2016 16TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS)

ISBN: 978-1-5090-4366-8

Año de publicación: 2016

Congreso: 16th European Conference on Radiation and its Effects on Components and Systems (RADECS)

Tipo: Aportación congreso

GOOGLE SCHOLAR
Fuente de los datos: WoS