Temperature and damping effects on the frequency dependence of electrostatic force microscopy force gradients
- Arinero, R.
- Trasobares, J.
- Girard, P.
- Ramonda, M.
- Clément, N.
Aldizkaria:
Journal of Applied Physics
ISSN: 0021-8979
Argitalpen urtea: 2013
Alea: 114
Zenbakia: 21
Mota: Artikulua