Temperature and damping effects on the frequency dependence of electrostatic force microscopy force gradients
- Arinero, R.
- Trasobares, J.
- Girard, P.
- Ramonda, M.
- Clément, N.
Revista:
Journal of Applied Physics
ISSN: 0021-8979
Ano de publicación: 2013
Volume: 114
Número: 21
Tipo: Artigo