Non-destructive one-shot device test under step-stress experiment with lognormal lifetime distribution

  1. Balakrishnan, N.
  2. Jaenada, M.
  3. Pardo, L.
Aldizkaria:
Journal of Computational and Applied Mathematics

ISSN: 0377-0427

Argitalpen urtea: 2024

Alea: 437

Mota: Artikulua

DOI: 10.1016/J.CAM.2023.115483 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus