Non-destructive one-shot device test under step-stress experiment with lognormal lifetime distribution

  1. Balakrishnan, N.
  2. Jaenada, M.
  3. Pardo, L.
Revista:
Journal of Computational and Applied Mathematics

ISSN: 0377-0427

Ano de publicación: 2024

Volume: 437

Tipo: Artigo

DOI: 10.1016/J.CAM.2023.115483 GOOGLE SCHOLAR lock_openAcceso aberto editor
Fonte de datos: Scopus