A study of the electronic states of NixMn3-xO 4+δ thin films using scanning tunneling microscopy and current imaging tunneling spectroscopy
- Basu, A.
- Brinkman, A.W.
- Schmidt, R.
- Klusek, Z.
- Kowalczyk, P.
- Datta, P.K.
ISSN: 0955-2219
Year of publication: 2004
Volume: 24
Issue: 6
Pages: 1149-1152
Type: Article