A study of the electronic states of NixMn3-xO 4+δ thin films using scanning tunneling microscopy and current imaging tunneling spectroscopy

  1. Basu, A.
  2. Brinkman, A.W.
  3. Schmidt, R.
  4. Klusek, Z.
  5. Kowalczyk, P.
  6. Datta, P.K.
Aldizkaria:
Journal of the European Ceramic Society

ISSN: 0955-2219

Argitalpen urtea: 2004

Alea: 24

Zenbakia: 6

Orrialdeak: 1149-1152

Mota: Artikulua

DOI: 10.1016/S0955-2219(03)00586-7 GOOGLE SCHOLAR
Datuen iturria: Scopus