The Optimization of a 4-Element Input Lens on a Hemispherical Deflector Analyzer Using SIMION

  1. Zouros, T.J.M.
  2. Kanellakopoulos, A.
  3. Madesis, I.
  4. Dimitriou, A.
  5. Fernández-Martín, M.
  6. Martinez, G.
  7. Mertzimekis, T.J.
Journal:
Microscopy and Microanalysis

ISSN: 1435-8115,  1431-9276

Year of publication: 2015

Volume: 21

Issue: S4

Pages: 148-153

Type: Article

DOI: 10.1017/S143192761501329X GOOGLE SCHOLAR
Data source: Scopus