Atomic-scale characterization of defects in oxygen plasma-treated graphene by scanning tunneling microscopy

1. Pham, V.D.
2. González, C.
3. Dappe, Y.J.
4. Dong, C.
5. Robinson, J.A.
6. Trampert, A.
7. Engel-Herbert, R.

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DOI: 10.1016/J.CARBON.2024.119260 GOOGLE SCHOLAR lock_openOpen access editor

Data source: Scopus