Atomic-scale characterization of defects in oxygen plasma-treated graphene by scanning tunneling microscopy

  1. Pham, V.D.
  2. González, C.
  3. Dappe, Y.J.
  4. Dong, C.
  5. Robinson, J.A.
  6. Trampert, A.
  7. Engel-Herbert, R.
Aldizkaria:
Carbon

ISSN: 0008-6223

Argitalpen urtea: 2024

Alea: 227

Mota: Artikulua

DOI: 10.1016/J.CARBON.2024.119260 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus