Validity of Thin Element Approximation in diffractometry of opaque thick objects

1. Sanchez-Brea, L.M.
2. Soria-Garcia, A.
3. Andres-Porras, J.
4. del Hoyo, J.
5. Torcal-Milla, F.J.
6. Elshorbagy, M.H.
7. Pastor-Villarrubia, V.
8. Alda, J.

Export

Export

×

MLA

modern-language-association

APA

apa

Chicago

chicago-fullnote-bibliography

Harvard

harvard-cite-them-right

Vancouver

vancouver-author-date

---

RIS BibTex

Export

×

This document cannot be exported because it belongs to another portal.

Full text

lock_openFull text externo

DOI: 10.1016/J.IJLEO.2024.171900 GOOGLE SCHOLAR lock_openOpen access editor

Data source: Scopus