Robust inference for an interval-monitored step-stress experiment with competing risks for failure with an application to capacitor data

  1. Balakrishnan, N.
  2. Jaenada, M.
  3. Pardo, L.
Revista:
Computers and Industrial Engineering

ISSN: 0360-8352

Any de publicació: 2024

Volum: 197

Tipus: Article

DOI: 10.1016/J.CIE.2024.110536 GOOGLE SCHOLAR lock_openAccés obert editor
Font de les dades: Scopus