Robust inference for an interval-monitored step-stress experiment with competing risks for failure with an application to capacitor data
- Balakrishnan, N.
- Jaenada, M.
- Pardo, L.
Aldizkaria:
Computers and Industrial Engineering
ISSN: 0360-8352
Argitalpen urtea: 2024
Alea: 197
Mota: Artikulua
