Publicaciones en colaboración con investigadores/as de Technical University of Darmstadt (4)

2000

  1. Influence of reactive ion etching on the microwave trap noise generated in Pt/n-GaAs schottky diode interfaces

    IEEE Electron Device Letters, Vol. 21, Núm. 11, pp. 515-517

  2. Monte carlo simulation of microwave noise temperature in cooled gaas and inp

    IEEE Transactions on Microwave Theory and Techniques, Vol. 48, Núm. 7 PART 2, pp. 1275-1279