DAVID
ATIENZA ALONSO
Interuniversity Microelectronics Centre
Lovaina, BélgicaPublicaciones en colaboración con investigadores/as de Interuniversity Microelectronics Centre (1)
2020
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Analysis of functional errors produced by long-Term workload-dependent bti degradation in ultralow power processors
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. 28, Núm. 10, pp. 2122-2133