Deformation-induced defect levels in ZnSe crystals

  1. Fernández, P.
  2. Piqueras, J.
  3. Urbieta, A.
  4. Rebane, Y.T.
  5. Shreter, Y.
Revue:
Semiconductor Science and Technology

ISSN: 0268-1242

Année de publication: 1999

Volumen: 14

Número: 5

Pages: 430-434

Type: Article

DOI: 10.1088/0268-1242/14/5/010 GOOGLE SCHOLAR
La source de données: Scopus