Structural and optoelectronical characterization of Si- SiO2 / SiO2 multilayers with applications in all Si tandem solar cells

  1. Maestre, D.
  2. Palais, O.
  3. Barakel, D.
  4. Pasquinelli, M.
  5. Alfonso, C.
  6. Gourbilleau, F.
  7. De Laurentis, M.
  8. Irace, A.
Revue:
Journal of Applied Physics

ISSN: 0021-8979

Année de publication: 2010

Volumen: 107

Número: 6

Type: Communication dans un congrès

DOI: 10.1063/1.3309761 GOOGLE SCHOLAR