Structural and optoelectronical characterization of Si- SiO2 / SiO2 multilayers with applications in all Si tandem solar cells

  1. Maestre, D.
  2. Palais, O.
  3. Barakel, D.
  4. Pasquinelli, M.
  5. Alfonso, C.
  6. Gourbilleau, F.
  7. De Laurentis, M.
  8. Irace, A.
Revista:
Journal of Applied Physics

ISSN: 0021-8979

Ano de publicación: 2010

Volume: 107

Número: 6

Tipo: Achega congreso

DOI: 10.1063/1.3309761 GOOGLE SCHOLAR