Failure mechanism of AlN nanocaps used to protect rare earth-implanted GaN during high temperature annealing

  1. Nogales, E.
  2. Martin, R.W.
  3. O'Donnell, K.P.
  4. Lorenz, K.
  5. Alves, E.
  6. Ruffenach, S.
  7. Briot, O.
Aldizkaria:
Applied Physics Letters

ISSN: 0003-6951

Argitalpen urtea: 2006

Alea: 88

Zenbakia: 3

Orrialdeak: 1-3

Mota: Artikulua

DOI: 10.1063/1.2162797 GOOGLE SCHOLAR
Datuen iturria: Scopus