Extended X-ray absorption fine structure studies of GaN epilayers doped with Er

  1. Katchkanov, V.
  2. Mosselmans, J.F.W.
  3. O'Donnell, K.P.
  4. Nogales, E.
  5. Hernandez, S.
  6. Martin, R.W.
  7. Steckl, A.
  8. Lee, D.S.
Journal:
Optical Materials

ISSN: 0925-3467

Year of publication: 2006

Volume: 28

Issue: 6-7

Pages: 785-789

Type: Conference paper

DOI: 10.1016/J.OPTMAT.2005.09.023 GOOGLE SCHOLAR
Data source: Scopus