Characterization of parasitics in microwave devices by comparing S and noise parameter measurements with two different on wafer calibration techniques

  1. Miranda, J.M.
  2. Fager, C.
  3. Zirath, H.
  4. Sakalas, P.
  5. Muñoz, S.
  6. Sebastián, J.L.
Zeitschrift:
Conference Record - IEEE Instrumentation and Measurement Technology Conference

Datum der Publikation: 2001

Ausgabe: 1

Seiten: 530-533

Art: Artikel

DOI: 10.1109/IMTC.2001.928875 GOOGLE SCHOLAR
Datenquelle: Scopus