Characterization of parasitics in microwave devices by comparing S and noise parameter measurements with two different on wafer calibration techniques
- Miranda, J.M.
- Fager, C.
- Zirath, H.
- Sakalas, P.
- Muñoz, S.
- Sebastián, J.L.
Revue:
Conference Record - IEEE Instrumentation and Measurement Technology Conference
Année de publication: 2001
Volumen: 1
Pages: 530-533
Type: Article