Characterization of parasitics in microwave devices by comparing S and noise parameter measurements with two different on wafer calibration techniques
- Miranda, J.M.
- Fager, C.
- Zirath, H.
- Sakalas, P.
- Muñoz, S.
- Sebastián, J.L.
Aldizkaria:
Conference Record - IEEE Instrumentation and Measurement Technology Conference
Argitalpen urtea: 2001
Alea: 1
Orrialdeak: 530-533
Mota: Artikulua