Influence of randomness during the interpretation of results from single-event experiments on SRAMs

  1. Franco, F.J.
  2. Clemente, J.A.
  3. Mecha, H.
  4. Velazco, R.
Journal:
IEEE Transactions on Device and Materials Reliability

ISSN: 1558-2574,  1530-4388

Year of publication: 2019

Volume: 19

Issue: 1

Pages: 104-111

Type: Article

DOI: 10.1109/TDMR.2018.2886358 GOOGLE SCHOLAR
Data source: Scopus