Influence of randomness during the interpretation of results from single-event experiments on SRAMs

  1. Franco, F.J.
  2. Clemente, J.A.
  3. Mecha, H.
  4. Velazco, R.
Aldizkaria:
IEEE Transactions on Device and Materials Reliability

ISSN: 1558-2574,  1530-4388

Argitalpen urtea: 2019

Alea: 19

Zenbakia: 1

Orrialdeak: 104-111

Mota: Artikulua

DOI: 10.1109/TDMR.2018.2886358 GOOGLE SCHOLAR
Datuen iturria: Scopus