A Methodology to Emulate Single Event Upsets in Flip-Flops Using FPGAs through Partial Reconfiguration and Instrumentation

  1. Serrano, F.
  2. Clemente, J.A.
  3. Mecha, H.
Journal:
IEEE Transactions on Nuclear Science

ISSN: 0018-9499

Year of publication: 2015

Volume: 62

Issue: 4

Pages: 1617-1624

Type: Article

DOI: 10.1109/TNS.2015.2447391 GOOGLE SCHOLAR
Data source: Scopus