Degradation of Instrumentation Amplifiers Due to the Nonionizing Energy Loss Damage

  1. Franco, F.J.
  2. Lozano, J.
  3. Santos, J.P.
  4. Agapito, J.A.
Revue:
IEEE Transactions on Nuclear Science

ISSN: 0018-9499

Année de publication: 2003

Volumen: 50

Número: 6 II

Pages: 2433-2440

Type: Communication dans un congrès

DOI: 10.1109/TNS.2003.820628 GOOGLE SCHOLAR