A nondestructive method for measuring thermal parameters of hermetically sealed electron devices
- Alieva, T.D.
- Akhundova, N.M.
- Abdinov, D.Sh.
ISSN: 0020-4412
Year of publication: 2000
Volume: 43
Issue: 1
Pages: 143-144
Type: Article
ISSN: 0020-4412
Year of publication: 2000
Volume: 43
Issue: 1
Pages: 143-144
Type: Article